About
I am a Ph.D. candidate in Materials Science and Technology at Tokyo University of Science, specializing in microscopy-based defect analysis and deep learning-enhanced image processing. My research focuses on understanding materials behavior at the nanoscale through advanced characterization techniques, particularly transmission electron microscopy (TEM) and scanning electron microscopy (SEM).
Currently supported by the JST SPRING scholarship, I am pursuing innovative approaches to automate defect detection and reconstruction. I will be joining the University of Oxford as a Visiting Researcher from July to October 2026, where I will collaborate on advanced microscopy research.
Skills & Focus Areas
Education & Experience
Publications
Presentations
Intellectual Property
Recognition & Awards
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JST SPRING ScholarJapan Science and Technology Agency
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Outstanding GraduateLiaoning Provincial Department of Education · 2021
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Registered SoftwareAI Search Engine Retrieval System V1.0 · 2019
